Analyses
Patent portfolios from a patent search can be analyzed by various criteria, and the results be visualized. The indications found here can be an important factor in your filing, development or other business decisions.
These are some of the built-in analyses of the base program:
Frequency Analyses of Applicants, Inventors, and Classes (IPC and ECLA)
Useful for competitors watch
Time Slice Analysis
By monitoring and displaying yearly filing counts, one can get an early indication of where a technology stands in its life-cycle.
Forward and Backward Citations
They can be used as one of several indicators for the quality of a patent.
Patent Map
By displaying company filing numers over the filing countries, one can gain a quick overview of the competition's geographical filing behaviour.
White Spot Analysis
Technology areas are identified which a company does not adequately cover compared to other players in this field.
Trial access
To experience the power of Sem-IP.com, please contact help(at)infoapps.de and request a time-limited access to Sem-IP.com at no charge or obligation.
Users
- Professional patent searchers
- R&D Managers
- Patent specialists
- Patent department
- Prüfer examiners
Benefits
Global coverage - always current
family-consolidated with drawings
All data in one application
Monitoring and Alerting
Contact
Phone +49 (0)89-3074857-0


